Description: BIST, or Built-In Self-Test, is a design technique used in embedded systems that allows a device to perform internal tests of its functionality and detect faults without external intervention. This methodology is based on integrating test circuits within the system itself, facilitating real-time error identification. BIST is especially valuable in environments where reliability is critical, such as aerospace, medical, and automotive industries. By allowing the system to evaluate itself, it reduces reliance on external testing and improves efficiency in fault detection. Additionally, BIST can be implemented at different levels, from testing individual components to more complex evaluations of complete systems. This technique not only optimizes the verification process but also contributes to cost and development time reduction by enabling engineers to identify and resolve issues more quickly and effectively. In summary, BIST represents a significant advancement in how embedded systems are designed and maintained, ensuring safer and more reliable operation.
